X-ray diffraction and Scattering
Daniela Morales, Ph.D.
Research Associate and Lab Manager
97 North Eagleville Road
Storrs CT 06269-3136
The D5005 powder diffractometer (Bragg – Brentano geometry with fixed sample) uses a copper sealed tube x-ray source and a scintillation point detector with a diffracted beam monochromator. In addition to the standard data collection geometry other modes are available: glancing angle, tube and detector scans, and rocking curve.
Bruker D8 Advance
The D8 Advance powder diffractometer (Bragg–Brentano geometry with fixed tube) utilizes a copper sealed tube x-ray generator and a Vantec-1 linear detector for high-speed data collection. In addition to the standard data collection geometry other modes are available: glancing angle, tube and detector scans, and rocking curve.
Bruker D2 Phaser
The D2 Phaser is a powder diffractometer (Bragg – Brentano fixed sample theta-theta geometry) with a LynxEye linear detector for high-speed data collection. Only standard data mode is available on this instrument.
Oxford Diffraction XCalibur PX Ultra
The XCalibur PX Ultra is a 4-circle (theta, chi, phi and Kappa) diffractometer with a high-speed, low noise, ccd Onyx area detector. The detector is optimized for macromolecular single crystal studies but is equally useful in examining bulk structure in materials such as fibers or films. It is also useful in determining single crystal orientation. The unit is equipped with an Oxford CryoJet coldstream for sensitive samples.
Bruker Angle X-ray Scattering (SAXS), Small
The SAXS examines the scattering from very large structural repeating patterns. The detector is a NanoStar area detector with variable path lengths up to 1 meter. The entire path length is evacuated to remove air scattering. The SAXS has two basic operational modes: high flux and high resolution. Supplemental hardware allows for sample temperature control, shear measurements, glancing angle SAXS, etc.
The GADDS is a 3-circle (theta, chi, phi and fixed Kappa) diffractometer with a high-speed multi-wire Hi-Star area detector. The system is optimized for metal samples by the use of a Chromium x-ray source to significantly reduce fluorescence.The instrument is useful in examining bulk structure in materials such as fibers or films. It is also useful in determining single crystal orientation.