
Thermo Fisher Scientific Center for Advanced Microscopy and Materials Analysis (CAMMA)
Contacts
General Contact
info@ims.uconn.edu
Staff

Roger Ristau, Ph.D.
Manager
- roger.ristau@uconn.edu
860.486.0375
Faculty Scientific Advisers

Steven Suib, Ph.D.
Professor
- Chemistry A-313
steven.suib@uconn.edu
860.486.4623
Location
Campus Address
Innovative Partnership Building (IPB)
UConn Tech Park
Mailing Address
159 Discovery Drive
Storrs, CT 06269
Instrumentation

Strata 200S Dual Beam
Gallium focused ion beam milling and SEM

Helios 460F1 Dual Beam
Gallium ion milling and high resolution SEM

Helios PFIB Dual Beam
Xenon ion high volume milling and SEM

Aspex Explorer VP SEM
Automated particle counting and analysis

Teneo LV SEM
Low vacuum SEM capable of imaging any solid material

Verios 460L SEM
High resolution surface imaging and elemental analysis

Tecnai T-12 TEM
General purpose TEM

Talos 200 S/TEM
Very high resolution imaging and elemental analysis

FEI Strata 400S DualBeam Focused Ion Beam System
The Strata 400 STEM DualBeam system is a fully digital Field Emission Scanning Electron Microscope (FE-SEM) equipped with Focused Ion Beam (FIB) technology and Flipstage/STEM assembly. It allows for complete in-situ sample preparation and high-resolution analysis.

Titan Themis ACEM
Single atom resolution imaging and elemental analysis