Thermo Fisher Scientific Center for Advanced Microscopy and Materials Analysis (CAMMA)

The Thermo Fisher Scientific Center for Advanced Microscopy and Materials Analysis (CAMMA) is one of the world’s foremost facilities for electron microscopy. Its microscopy instruments include the Titan Themis for sub-angstrom analysis of materials and the Talos 200 S/TEM for simultaneous quantitative enery dispersive spectroscopy and analysis to uncover chemical composition of materials. This equipment is available for collaborative research with industry partners including applications for clean energy materials and the testing of additively-manufactured components such as those found in medical devices and polymeric materials for biomedical applications.

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Contacts

General Contact

info@ims.uconn.edu

Staff

Faculty Scientific Advisers

Location

Campus Address

Innovative Partnership Building (IPB)
UConn Tech Park

Mailing Address

159 Discovery Drive
Storrs, CT 06269

Instrumentation

Strata 200S Dual Beam

Gallium focused ion beam milling and SEM

Internal Rates

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Helios 460F1 Dual Beam

Gallium ion milling and high resolution SEM

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Helios PFIB Dual Beam

Xenon ion high volume milling and SEM

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Aspex Explorer VP SEM

Automated particle counting and analysis

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Teneo LV SEM

Low vacuum SEM capable of imaging any solid material

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Verios 460L SEM

High resolution surface imaging and elemental analysis

Internal Rates

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Tecnai T-12 TEM

General purpose TEM

Internal Rates

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Talos 200 S/TEM

Very high resolution imaging and elemental analysis

Internal Rates

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FEI Strata 400S DualBeam Focused Ion Beam System

The Strata 400 STEM DualBeam system is a fully digital Field Emission Scanning Electron Microscope (FE-SEM) equipped with Focused Ion Beam (FIB) technology and Flipstage/STEM assembly. It allows for complete in-situ sample preparation and high-resolution analysis.

Specifications

Special features of IMS DualBeam system include:

Ultra-high resolution electron optics with SE and BSE in-lens detection and STEM imaging
High-resolution Ion Optics (SidewinderTM column)
Omniprobe AutoProbe 200.2 sample extraction system
Flipstage with pivoting rowbar for TEM grids
Retractable, annular STEM detector
EDAX EDS microanalysis system
Auto ‘Slice and View’ software with ‘3D’ reconstruction

Internal Rates

External Rates

Titan Themis ACEM

Single atom resolution imaging and elemental analysis

Internal Rates

External Rates

$65/hour	Unassisted
$100/hour	Assisted

$65/hour	Unassisted
$140/hour	Assisted

$410/hour	Assisted
$260/hour	Unassisted

$65/hour	Unassisted
$140/hour	Assisted

$410/hour	Assisted
$260/hour	Unassisted

Thermo Fisher Scientific Center for Advanced Microscopy and Materials Analysis (CAMMA)

Thermo Fisher Scientific Center for Advanced Microscopy and Materials Analysis (CAMMA)

Contacts

General Contact

Staff

Roger Ristau, Ph.D.

Manager

Faculty Scientific Advisers

Steven Suib, Ph.D.

Professor

Location

Campus Address

Mailing Address

Instrumentation

Strata 200S Dual Beam

Helios 460F1 Dual Beam

Helios PFIB Dual Beam

Aspex Explorer VP SEM

Teneo LV SEM

Verios 460L SEM

Tecnai T-12 TEM

Talos 200 S/TEM

FEI Strata 400S DualBeam Focused Ion Beam System

Titan Themis ACEM

$30/hour	Unassisted
$105/hour	Assisted

$270/hour	Assisted
$120/hour	Unassisted

$45/hour	Unassisted
$120/hour	Assisted

$330/hour	Assisted
$180/hour	Unassisted