Nano Measurements

Nano-Measurements

The Nano-Measurements facility uses atomic force microscopy (AFM) and related techniques to look at surfaces of materials. High speed experiments are a unique features of these studies.

Contacts

General Contact

imsinfo@uconn.edu

Faculty Scientific Advisers

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Steven Suib, Ph.D.

Professor
Chemistry A-313
Steven.suib@uconn.edu
860.486.4623

Location

Campus Address

Institute of Materials Science
Storrs Campus

Mailing Address

97 North Eagleville Road
Storrs CT 06269-3136

Instrumentation

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Asylum Research Cypher

UConn is proud to be one of the first installation sites worldwide of this next generation atomic force microscope (AFM). The Cypher features picometer resolution with closed loop atomic imaging capabilities, has integrated vibration isolation, and offers a maximum scan range of 30 um (xy) and 5 um (z). The system is devoted to high resolution studies, as well as the development of novel High Speed Surface Property Mapping (HSSPM) capabilities.

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Asylum Research MFP-3d

This is a cutting edge atomic force microscope (AFM) with sub-nanometer and nanoNewton resolution. The device is presently configured to measure local topography, mechanical compliance, piezoactuation, and electric and magnetic fields. Top and bottom view optics allow precise tip-sample positioning.

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Asylum Research MFP-3d-IO

This second MFP-3d system is mounted directly on a Nikon inverted optical microscope for simultaneous AFM and bright field optical imaging. A temperature and fluid controller is available, making this instrument ideal for biological or electrochemical investigations. Nanometer scale topography, amplitude, and phase data can therefore be compared with up to 3000x optical images.

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AFM Lithography

All three AFM systems feature a customizable lithography suite for precise control of the AFM tip. User programmable loads or biases can be applied at various tip scanning rates with nanometer scale spatial resolution in x, y, and z directions, allowing a range of sample manipulations. As an example, the UConn university seal has been reproduced with dimensions of 4 um on a side.

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Omicron UHV AFM/STM

This high resolution ultra high vacuum unit is capable of atomic scale resolution with atomic force or scanning tunneling microscopy (STM) modes, measured independently or simultaneously. Scanning tunneling spectroscopy additionally allows local electronic states to be probed.