Atomic Force Microscopy

Atomic Force Microscopy

This facility uses atomic force microscopy and related techniques to look at surfaces of materials. High speed experiments are a unique features of these studies.

Contacts

General Contact

imsinfo@uconn.edu

Staff

Bryan Huey, Ph.D.

bryan.huey@uconn.edu
860.486.3284

Location

Campus Address

Institute of Materials Science
Science 1
Storrs Campus

Mailing Address

25 King Hill Road, Unit 3136
Storrs, CT 06269-3136

Instrumentation

IMS CypherES

Asylum Research Cypher ES/VRS

The AFM user facility residing within IMS excels at multiple advanced characterization methods.  Lab personnel have substantial expertise with a wide range of novice to expert AFM techniques that utilize creative methods to achieve imaging needs.

Accessories include VR high speed scanner, dual gain ORCA for CAFM, high V module for TDDB, and all hardware and software for nanolithography, contact and AC mode (‘Tapping’) imaging, and contrast mechanisms spanning phase, CAFM, pcAFM, EFM, MFM, SSPM/KPFM, PFM, AFAM, FFM, and F-d measurements and mapping.

IMS Asylum CypherS

Asylum Research Cypher S

The AFM user facility residing within IMS excels at multiple advanced characterization methods.  Lab personnel have substantial expertise with a wide range of novice to expert AFM techniques that utilize creative methods to achieve imaging needs.

Accessories include dual gain ORCA for CAFM, in situ oblique laser illumination for PC-AFM, gas lines for N2 or Ar overpressure, and all hardware and software for nanolithography, contact and AC mode (‘Tapping’) imaging, and contrast mechanisms spanning phase, CAFM, pcAFM, EFM, MFM, SSPM/KPFM, PFM, AFAM, FFM, and F-d measurements and mapping.

IMS Asylum research MFP-3d-SA

Asylum Research mfp-3D-SA

The AFM user facility residing within IMS excels at multiple advanced characterization methods.  Lab personnel have substantial expertise with a wide range of novice to expert AFM techniques that utilize creative methods to achieve imaging needs.

Accessories include POLY-heater for variable temperature AFM (RT up to 300C), humidity control via salt solutions, and all hardware and software for nanolithography, contact and AC mode (‘Tapping’) imaging, and contrast mechanisms spanning phase, CAFM, pcAFM, EFM, MFM, SSPM/KPFM, PFM, AFAM, FFM, and F-d measurements and mapping.

IMS ASYLUM RESEARCH MFP-Bio

Asylum Research mfp-3D-BIO

The AFM user facility residing within IMS excels at multiple advanced characterization methods.  Lab personnel have substantial expertise with a wide range of novice to expert AFM techniques that utilize creative methods to achieve imaging needs.

Accessories include liquid cell with RT up to 40C temperature control, POLY heater for variable temperature AFM (RT up to 300C), humidity control via salt solutions, and all hardware and software for nanolithography, contact and AC mode (‘Tapping’) imaging, and contrast mechanisms spanning phase, CAFM, pcAFM, EFM, MFM, SSPM/KPFM, PFM, AFAM, FFM, and F-d measurements and mapping.